Metrology

Metrology

The semiconductor industry says that "we can build it if we can measure it". The simulation of optical scatterometry from the first principles of physics is performed by the SCATT software. This software helps understand the sensitivity of signals to process variations, as well as the applicability of the system to specific layers and measurements.

SCATT

SCATT is a software tool used to simulate light scattering on microelectronic patterns. The software is based on the rigorous coupled wave analysis (RCWA) physical model. The software is independent on any equipment vendor. It can be used to Independently evaluate any existing or new scatterometry techniques Find sensitivities of optical schemes to variations of the pattern Determine the optimum set-up to provide the best sensitivity for the desired pattern The software utilizes a user friendly 3D graphical user interface. The input parameters are: materials and their thicknesses: dielectrics, semiconductors, metals a description of the 3D geometry of the pattern the optical constants of the materials the light source: wavelength, incident angle, azimuth angle, polarization The output of the software is the intensity of light in the requested transmitted or/and reflected diffraction orders.[more...]


Note that aBeam stopped selling some of its electron beam simulation and image analysis software.